LED

EPI LED (OPI-175 El Test System)
Equipment for measuring both electrical and optical characteristics of LED epi wafer

Program measurement screen	Sample measurement result screen	Sample measurement result screen

Measurement of EL characteristics for LED

• Measuring Electroluminescence for LED epi wafer
• Measuring light emission for upper / lower wafer using glass, measurement sensors in upper and lower area.
• It enables wafer to be moved to xyz direction using knobs considering covenience for contact work and productivity as much as possible.
• Luminous header has exact photo-deteciting power using 2 inch's Lamp Measurement System
• Improving precision of measurement by using both Luminous intensity meter and spectrometer simultaneously
• Providing software environment considering user's convenience as much as possible

Integrated Measurement of optical, electrical characterisitcs

• Optical characteristics measurement items
  - Spectral characteristics: peak wavelength, primary wavelength, medium wavelength, central wavelength, Full Width Half Max, color coordinate, color purity, color temperature, Color rendering index
  - Intensity of radiation: Luminous intensity, intensity radiation
• Electrical characteristics measurement items
  Forward current, backward voltage, backward current and backward voltage
• Sweep measurement
  Current-voltage, Voltage-current, Current-luminous characteristics
• Measurement for spectral characteristics using high sensitivity, high resolution spectrometer
• It uses Integrating Sphere System-typed input photometer and spectrometer for exact and stable Luminous intensity by correcting color of PD on real time basis.
• Current supply for measuring electrical characteristics using high speed and high precision sourcmeter is allowed up to 1A

It is optimized for quality inspection, R&D, and Reliability measurement

• Sweep measurement : current-voltage, voltage-current, current-light
• Various spectral areas(UV, UV-VIS, VIS, VIS-IR)are selectable
• Various power supplies (voltage and current) using Keithley2400 Sourcemeter and measurement ranges are selectable
• Special functions can be added based on customer requirement(optional)

Convenient user environment

• Intuitively recognizing measurement resul
  It displays measured spectrum. color coordinate and measurement result list
  Summarized Graph display for each measurement item Mapping display
• Setting various conditions
  User selection for optical and electrical characteristic item
  Sweep measurement set up
• Grade set up function
• Individual or total value storing for measured value in upper/lower sensor
• Measured date is stored (CSV file) so that variations is measurement for optical / electrical characteristic are intuitively recognized
• For managing measurement conditions, they can be stored of retrieved from project file

Technical support and A/S

• User-centric setup and user guide
• Software development based on customer requiirement
• Providing new measurement method and information via LED standard consortium and Internationl Commission on Illumination and Luminous intensity measurement club activities
• Rapid A/S
• Support for JIG to help various sample measurement